CHARACTERIZATION AND METROLOGY
CHAIRMEN
Dr. Alfonso Perez Garcia(CIMAV-MTY), alfonso.perez@cimav.edu.mx
Dr . Alfredo Morales Sánchez (INAOE), alfredom@inaoep.mx
Dra. Liliana Licea Jiménez (CIMAV-MTY), liliana.licea@cimav.edu.mx
Dr. Francisco Javier Flores Ruiz (IF-BUAP) fflores@ifuap.buap.mx
Optic and electronic spectroscopy and microscopy are very important and relevant fields of knowledge when it comes to fundamental and applied research in materials science. Materials and surfaces have been widely studied and characterized by using linear optics through reflectance, transmittance, absorbance, and scattering properties. By contrast, nonlinear optics are closely related to the understanding of materials and surfaces, since such phenomena for example, second harmonic generation, wave mixing, parametric up and down conversion to mention only a few are directly related to material features, such as, crystallinity, centrosymmetry, anisotropy and quantum properties.
This symposium is dedicated to the presentation and discussion of characterization and metrology within the following topics:
- Materials
- Surfaces
- Linear and nonlinear optical properties
- Raman characterization
- Nonlinear optical microscopy
- Ultrafast light-matter interaction
- Laser processing of materials: micro and nanostructures
- Laser-tissue interactions
- Laser-induced cavitation
- Photonics
- Biophotonics
- Opticaltrapping